Electron microscopy offers higher magnification views and elemental identification for small particles removed from a sample

High magnification and elemental analysis using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry

Scanning Electron Microscopy with Energy Dispersive
X-ray Spectrometry (SEM/EDS) offers valuable information that compliments the data collected using light microscopy techniques, and the molecular data from FTIR or Raman.  The EDS detector provides elemental composition along with amounts of each elemental detected.  The higher magnification also can reveal how materials are associated.

SEM Applications

·High magnification (> 5000X) examinations of sample particles to reveal morphology

·Elemental analysis of materials including pigments, metals, glass, ceramics

 

Scanning Electron Microscopy

Center for Art Materials Analysis, Inc.

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Center for Art
Materials Analysis, Inc.

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